Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Zachary H. Levine;|
|Title:||The Boundary of X-Ray and Electron Tomography|
|Published:||January 03, 2005|
|Abstract:||Samples a few micrometers in total size offer a challenge to both x-ray and electron tomography. X-ray tomography originated imaging the human body with millimeter resolution, but the resolution has been reduced by over 7 orders of magnitude by the use of synchrotron sources and Fresnel zone plates, leading to an achieved resolution of 20 nm in favorable cases. Further progress may require phase retrieval. Electron tomography originated on very thin samples (perhaps 100 nm thick) but recently samples of over 1 micrometer have been studied with conventional instruments. The study of thicker samples requires understanding tomography in the multiple scattering regime.[Abstract only to appear in print.]|
|Keywords:||electron tomography,x-ray microtomography|