NIST logo

Publication Citation: Sulfer-K[beta] X-Ray Emission From Carbonyl Sulfide: Variations With Polarization and Excitation Energy at the S-K Threshold

NIST Authors in Bold

Author(s): K E. Miyano; Uwe Arp; S H. Southworth; T E. Meehan; T R. Walsh; F P. Larkins;
Title: Sulfer-K[beta] X-Ray Emission From Carbonyl Sulfide: Variations With Polarization and Excitation Energy at the S-K Threshold
Published: April 01, 1998
Abstract: Sulfur-K[beta] x-ray emission spectra from carbonyl sulfide (OCS) have been measured with resonant excitation at the sulfur K absorption threshold and compared with results of [Δ]SCF and [Δ]DCI calculations. For excitation to the strong 4[pi] absorption resonance, a splitting of the main emission peak is interpreted in terms of influence of the 4[pi] electron on the final valence-hole states. The polarization selectivity of the emission spectrometer was used to distinguish emission polarized parallel versus perpendicular with respect to the polarization of the excitation radiation. The observed polarization dependence is consistent with the molecular symmetries of the calculated intermediate and final states.
Citation: Physical Review A (Atomic, Molecular and Optical Physics)
Volume: 57
Issue: No. 4
Keywords: [Δ]SDCI calculations;carbonyl sulfide;molecular symmetries;polarization dependence;sulfur K[beta] emission;x-ray emission
Research Areas: