| Author(s): |
James K. McCarthy; A Baciero; B Zurro; Uwe Arp; Charles S. Tarrio; Thomas B. Lucatorto; A Morono; P Martin; E R. Hodgson; |
| Title: |
Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation |
| Published: |
December 01, 2002 |
| Abstract: |
We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, the radiation hardness of such screens, which have application as a narrow-band radiation detectors for a hot fusion plasma diagnostic, is reported here for MeV electrons. Finally, a simple model constructed to obtain the carrier diffusion length and the bulk efficiency of this material. |
| Citation: |
Journal of Applied Physics |
| Volume: |
92 |
| Issue: |
No. 11 |
| Keywords: |
quantum efficiency;radiation hardness;synchrotron radiation |
| Research Areas: |
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