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|Author(s):||James K. McCarthy; A Baciero; B Zurro; Uwe Arp; Charles S. Tarrio; Thomas B. Lucatorto; A Morono; P Martin; E R. Hodgson;|
|Title:||Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation|
|Published:||December 01, 2002|
|Abstract:||We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, the radiation hardness of such screens, which have application as a narrow-band radiation detectors for a hot fusion plasma diagnostic, is reported here for MeV electrons. Finally, a simple model constructed to obtain the carrier diffusion length and the bulk efficiency of this material.|
|Citation:||Journal of Applied Physics|
|Keywords:||quantum efficiency,radiation hardness,synchrotron radiation|