NIST logo

Publication Citation: Photoexcited Hot Electron Relaxation Processes in n-HgCdTe Through Impact Ionization Into Traps, Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector Materials

NIST Authors in Bold

Author(s): David G. Seiler; J R. Lowney; Chris L. Littler; I. T. Yoon; M. R. Loloee;
Title: Photoexcited Hot Electron Relaxation Processes in n-HgCdTe Through Impact Ionization Into Traps, Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector Materials
Published: June 01, 1991
Abstract:
Citation: Journal of Vacuum Science and Technology
Volume: B 9
Issue: 3
Pages: pp. 1847 - 1851
Research Areas:
PDF version: PDF Document Click here to retrieve PDF version of paper (557KB)