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|Author(s):||John A. Small; Dale E. Newbury; J H. Scott; L R. King; Sae Woo Nam; Kent D. Irwin; Steven Deiker; S Barkan; E Iwaniczko;|
|Title:||A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems|
|Published:||December 01, 2002|
|Abstract:||NIST, Gaithersburg has recently installed a first generation silicon drift dectector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ( cal-EDS) on a JEOL 840 SEM1 , as shown in Fig.1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector tecnologies as users and to compare preliminary results with conventional systems.|
|Citation:||Microscopy and Microanalysis|
|Keywords:||instrument,JEOL wavelength dispersive x-ray spectro,microcalorimeter,silcon drift detector systems|