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Publication Citation: A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems

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Author(s): John A. Small; Dale E. Newbury; J H. Scott; L R. King; Sae Woo Nam; Kent D. Irwin; Steven Deiker; S Barkan; E Iwaniczko;
Title: A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems
Published: December 01, 2002
Abstract: NIST, Gaithersburg has recently installed a first generation silicon drift dectector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ( cal-EDS) on a JEOL 840 SEM1 , as shown in Fig.1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector tecnologies as users and to compare preliminary results with conventional systems.
Citation: Microscopy and Microanalysis
Volume: 8
Issue: Suppl. 2
Keywords: instrument;JEOL wavelength dispersive x-ray spectro;microcalorimeter;silcon drift detector systems
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