| Author(s): |
Christopher W. Jones; John A. Kramar; Stuart Davidson; Richard Leach; Jon R. Pratt; |
| Title: |
Comparison of NIST SI Force Scale to NPL SI Mass Scale |
| Published: |
October 19, 2008 |
| Abstract: |
Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at Gaithersburg and used as deadweights on the NIST electrostatic force balance, to facilitate a mass-force scale comparison. A previously unaccounted systematic discrepancy of about 10 nN was discovered in the force measurements, correlated with the position of the mass lift system. With this correction, the measurements are in agreement. This work highlights the importance of calibration intercomparisons. |
| Conference: |
American Society for Precision Engineering 23rd Annual Meeting |
| Proceedings: |
Proceedings from the American Society for Precision Engineering, 2008 |
| Pages: |
4 pp. |
| Location: |
Portland, OR |
| Dates: |
October 19-24, 2008 |
| Keywords: |
nanonewton; SI traceability; electrostatic force balance; small mass; small force |
| Research Areas: |
Characterization, Nanometrology, and Nanoscale Measurements |
| PDF version: |
 Click here to retrieve PDF version of paper (46KB) |
