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NIST Authors in Bold
|Author(s):||D Xiang; Gerald V. Blessing; Nelson N. Hsu;|
|Title:||Time-and-Polarization-Resolved Acoustic Microscopy of Surface and Subsurface Cracks|
|Published:||December 01, 1999|
|Abstract:||Time-and-polarization-resolved acoustic microscopy with an improved-spatial-resolution line-focus transducer of simply reduced active element width is applied to characterize surface and subsurface cracks. From acoustic images obtained from scanning cracks in different transverse directions and orientations, the presence, orientation, length and depth of cracks are induced.|
|Conference:||International Symposium on Nondestructive Characterization of Materials|
|Proceedings:||Proceedings of the International Symposium on Nondestructive Characterization of Materials|
|Dates:||June 28-July 2, 1999|
|Research Areas:||Mechanical Metrology|