Publication Citation
NIST Authors in Bold
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| Author(s): | Joseph J. Kopanski; |
|---|---|
| Title: | Charge Trapping in Cubic Silicon Carbide MIS Capacitors |
| Published: | December 31, 1992 |
| Abstract: | |
| Proceedings: | Springer Proceedings in Physics - Amorphous and Crystalline Silicon Carbide III |
| Pages: | pp. 119 - 124 |
| Location: | Washington, DC |
| Dates: | April 11-13, 1990 |
| Research Areas: |