| Author(s): |
Dylan F. Williams; David K. Walker; |
| Title: |
In-Line Multiport Calibration |
| Published: |
June 01, 1998 |
| Abstract: |
We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-port measurement system. |
| Proceedings: |
Tech Dig., Auto. RF Tech. Group Conf. |
| Pages: |
pp. 88 - 90 |
| Location: |
Baltimore, MD |
| Dates: |
June 7-12, 1998 |
| Keywords: |
;electrical impedance standard;on-wafer calibration;wafer probes; |
| Research Areas: |
Electromagnetics |
