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Publication Citation: Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits

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Author(s): Joseph J. Kopanski; David L. Blackburn; George G. Harman; David W. Berning;
Title: Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
Published: January 20, 1996
Abstract:
Proceedings: Proc., IEEE Components, Packaging, and Manufacturing Technology Society
Pages: pp. 137 - 142
Location: San Diego, CA
Research Areas: