NIST Authors in Bold
| Author(s): | Joseph J. Kopanski; Donald B. Novotny; |
|---|---|
| Title: | Electrical Characterization of Beta Silicon Carbide MIS Capacitors with Thermally Grown or Chemical-Vapor-Deposited Oxides |
| Published: | December 31, 1989 |
| Abstract: | |
| Proceedings: | Extended Abstracts of the Electrochemical Society |
| Pages: | pp. 722 - 723 |
| Location: | Hollywood, FL |
| Dates: | October 15-20, 1989 |
| Research Areas: |