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|Author(s):||Donna C. Hurley; Roy H. Geiss; N Jennett; Malgorzata Kopycinska-Mueller; A Maxwell; Jens Mueller; David T. Read; J Wright;|
|Title:||Acoustical methods to determine thin-film and nanoscale mechanical properties|
|Published:||May 31, 2005|
|Abstract:||We describe two acoustical methods to evaluate the mechanical properties of thin films and nanoscale structures: atomic force acoustic microscopy and surface acoustic wave spectroscopy. The elastic properties of an 800-nm-thick nickel film were examined with both methods as well as nanoindentation and microtensile testing techiques. Values for the indentation modulus M measured in the film's out-of-plane direction and Young's modulus E measured in the in-plane direction were lower than expected for an isotropic, polycrystalline film. The reduction in stiffness was attributed to grain-boundary effects in the nanocrystalline film. Agreement between the measured and predicted values was improved by reducing the Ni elastic moduli by 10-15 %. Using the measured elastic properties to interpret the surface-wave data, we found that the film density was 1-2 % lower than bulk values. Our results illustrate how complementary methods can provide a more complete and physically realistic picture of a film's properties.|
|Citation:||Journal of Materials Research|
|Pages:||pp. 1186 - 1193|
|Keywords:||atomic force microscopy,elastic properties,microtensile testing,nanoindentation,surface acoustic waves,thin films|
|PDF version:||Click here to retrieve PDF version of paper (164KB)|