Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Residual stress determination by diffraction: Modeling and applications

NIST Authors in Bold

Author(s): Davor Balzar; N C. Popa;
Title: Residual stress determination by diffraction: Modeling and applications
Published: January 01, 2004
Abstract: Residual stress plays an important role in shaping Iilaterials properties. We present both the method to determine texture-weighted strain orientation distribution function for arbitrary crystal and sample symmetries and an example of the determination of the average macroscopic strain tensor as applied to the orthorhombic crystal symmetry and general triclinic sample symmetry of the uranium sample. The strain tensor was determined Dy the least-squares refinement of interplanar spacings for 19 Bragg reflections, as determined from the neutron TOF measurements at LANSCE. An annealed uranium plate was used as a reference sample, thus providing reference interplanar spacings for all 19 reflections. The resulting strain and stress tensors show strong shear components that could not be detected through the measurements customary carried out 31ong a few principal directions in the sample.
Citation: Computer Modeling Eng. Sci.
Pages: pp. 1409 - 1414
Keywords: neutron diffraction,residual stress,Rietveld refinement
Research Areas: Metals, Materials performance, Materials Science