Publication Citation
NIST Authors in Bold
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| Author(s): | Joseph J. Kopanski; David L. Blackburn; George G. Harman; David W. Berning; |
|---|---|
| Title: | Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits |
| Published: | December 31, 1991 |
| Abstract: | |
| Proceedings: | Proc., First International High Temperature Electronics Conference |
| Pages: | pp. 137 - 142 |
| Location: | Albuquerque, NM |
| Dates: | June 16-20, 1991 |
| Research Areas: |