NIST logo

Publication Citation: Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits

NIST Authors in Bold

Author(s): Joseph J. Kopanski; David L. Blackburn; George G. Harman; David W. Berning;
Title: Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
Published: December 31, 1991
Abstract:
Proceedings: Proc., First International High Temperature Electronics Conference
Pages: pp. 137 - 142
Location: Albuquerque, NM
Dates: June 16-20, 1991
Research Areas: