Publication Citation
NIST Authors in Bold
 |
| Author(s): | Chris L. Littler; X. N. Song; Z. Yu; J. L. Elkind; J R. Lowney; David G. Seiler; |
|---|---|
| Title: | RII Spectroscopy of Trap Levels in Bulk and LPE Hg1-xCdxTe |
| Published: | December 31, 1993 |
| Abstract: | |
| Citation: | Semiconductor Science and Technology |
| Volume: | 8 |
| Pages: | pp. S317 - S321 |
| Research Areas: |