U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Failure Dynamics of the IGBT During Turn-Off for Unclamped Inductive Loading Conditions

Published

Author(s)

Chien-Chung Shen, Allen R. Hefner Jr., David W. Berning, J B. Bernstein

Abstract

The internal failure dynamics of the Insulated Gate Bipolar Transistor (IBGT) for unclamped inductive switching (UIS) conditions are studied using simulations and measurements.  The UIS measurements are made using a unique, automated nondestructive Revers
Proceedings Title
Proc., IEEE Industry Applications Society (IAS) Annual Meeting
Conference Dates
October 12-16, 1998
Conference Location
St. Louis, MO, USA
Conference Title
IEEE Industry Applications Society (IAS) Annual Meeting
Pub Type
Conferences

Download Paper

Local Download

Keywords

automatic tester, avalanche, failure, IGBT, model, RBSOA
Electronics and Advanced communications

Citation

Shen, C. , Hefner Jr., A. , Berning, D. and Bernstein, J. (1998), Failure Dynamics of the IGBT During Turn-Off for Unclamped Inductive Loading Conditions, Proc., IEEE Industry Applications Society (IAS) Annual Meeting, St. Louis, MO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=3393 (Accessed April 25, 2024)

Created December 30, 1998, Updated October 12, 2021