NIST Authors in Bold
| Author(s): | YaShian Li-Baboud; Eric D. Simmon; Yaw S. Obeng; |
|---|---|
| Title: | Identity management standards for product life cycle of electronic parts |
| Published: | September 10, 2008 |
| Abstract: | The high profit opportunities, the diffused outsourcing of manufacturing and the structure of distribution networks make the electronics and its components susceptible to counterfeiting. Distinguishing the genuine article from counterfeit is increasingly challenging, and accurate product authentication will require efficient access to information. Central to this objective is the management of the information and tools needed for product authentication. It is imperative to have integrated information flow throughout the product life cycle, from conception to disposal, such that relevant data would be available to the necessary parties from manufacturers to end-users to customs and other law enforcement officers. In this presentation, we plan to discuss key concepts for managing such product authentication information, how information standards can contribute to the mitigation of counterfeiting risks, current and upcoming standardization efforts, standardization pitfalls to be aware of, as well as other potential standardization areas to facilitate product identity information sharing for mitigating counterfeiting risks in the product lifecycle of electronic parts. |
| Proceedings: | Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts |
| Pages: | 27 pp. |
| Location: | College Park, MD |
| Dates: | September 9-10, 2008 |
| Keywords: | electronics product authentication; identity management standards; anti-counterfeiting |
| Research Areas: | |
| PDF version: | Click here to retrieve PDF version of paper (4MB) |