Craig, R.
(2003),
Measurement assurance program for wavelength dependence of polarization dependent loss in fiber optic devices over the wavelength range from 1535 nm to 1560 nm, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.250-60
(Accessed April 24, 2024)
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Measurement assurance program for wavelength dependence of polarization dependent loss in fiber optic devices over the wavelength range from 1535 nm to 1560 nm
Published
Author(s)
Abstract
This paper provides the documentation to establish a measurement assurance program (MAP) using an optical fiber diattenuator for the calibration of polarization-dependent loss (PDL) across the 1535 to 1560 nm range of telecommunication wavelengths. This MAP transfer standard (or artifact) is based on an all fiber design with well-characterized PDL as a function of wavelength and temperature. This MAP is intended for the calibration of PDL measurement equipment, and is not intended for the simulation of PDL in actual systems. This document details the uncertainty analysis, certification procedure and suggested use for the MAP.Citation
Special Publication (NIST SP) - 250-60
Report Number
250-60
NIST Pub Series
Pub Type
NIST Pubs
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Keywords
diattenuator, fiber optic, measurement assurance program, Mueller matrix, PDL, polarization dependent loss, spectral dependence, wavelength-dependence, WDM
Citation
Created February 1, 2003, Updated November 10, 2018