| Author(s): |
Igor Vayshenker; J. Bermudez; J. Molina; Z. Ruiz; David J. Livigni; Xiaoyu X. Li; John H. Lehman; |
| Title: |
Bilateral optical power meter comparison between NIST and CENAM |
| Published: |
July 01, 2008 |
| Abstract: |
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wavelengths of 1302 nm and 1546 nm are reported. Both laboratories’ reference standards were compared by means of a temperature-controlled optical trap detector. Measurement results showed a largest difference of less than 3.4 parts in 103, which is within the combined expanded (k=2) uncertainty for the laboratories’ reference standards. |
| Citation: |
Journal of Research of the National Institute of Standards and Technology |
| Volume: |
113 |
| Issue: |
4 |
| Pages: |
pp. 205 - 208 |
| Keywords: |
international comparison; optical fiber power |
| Research Areas: |
Optical Metrology |
| PDF version: |
 Click here to retrieve PDF version of paper (235KB) |
