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Publication Citation: Uncertainty Analysis for Noise-Parameter Measurements

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Author(s): James P. Randa;
Title: Uncertainty Analysis for Noise-Parameter Measurements
Published: June 08, 2008
Abstract: A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Conference: Conference on Precision Electromagnetic Measurements
Proceedings: CPEM 2008
Pages: pp. 498 - 499
Location: Broomfield, CO
Dates: June 8-13, 2008
Research Areas: Electronics & Telecommunications, Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (11MB)