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|Author(s):||James P. Randa;|
|Title:||Uncertainty Analysis for Noise-Parameter Measurements|
|Published:||June 08, 2008|
|Abstract:||A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.|
|Conference:||Conference on Precision Electromagnetic Measurements|
|Pages:||pp. 498 - 499|
|Dates:||June 8-13, 2008|
|Research Areas:||Electronics & Telecommunications, Electromagnetics|
|PDF version:||Click here to retrieve PDF version of paper (11MB)|