| Author(s): |
James P. Randa; |
| Title: |
Uncertainty Analysis for Noise-Parameter Measurements |
| Published: |
June 08, 2008 |
| Abstract: |
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters. |
| Conference: |
Conference on Precision Electromagnetic Measurements |
| Proceedings: |
CPEM 2008 |
| Pages: |
pp. 498 - 499 |
| Location: |
Broomfield, CO |
| Dates: |
June 8-13, 2008 |
| Research Areas: |
Electronics & Telecommunications, Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (11MB) |
