Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||David G. Seiler;|
|Title:||Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization|
|Published:||December 09, 2007|
|Citation:||Metrology, Nanocharacterization, and Instrumentation for Emerging Nanotechnology and Nanoelectronics|
|Research Areas:||Semiconductor Materials|