Publication Citation
NIST Authors in Bold
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| Author(s): | David G. Seiler; |
|---|---|
| Title: | Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization |
| Published: | December 09, 2007 |
| Abstract: | |
| Citation: | Metrology, Nanocharacterization, and Instrumentation for Emerging Nanotechnology and Nanoelectronics |
| Pages: | 35 pp. |
| Research Areas: | Semiconductor Materials |