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Publication Citation: Verification of an EMC facility retro fit using time domain and field uniformity measurements

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Author(s): Dennis G. Camell; Michael Taylor; Robert T. Johnk; Benjamin Davis;
Title: Verification of an EMC facility retro fit using time domain and field uniformity measurements
Published: July 08, 2007
Abstract: This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of insertion data was used to compare before and after measurements of the chamber surfaces. A free space reference provided improved data fidelity. After the update a standard IEC 61000-4-3 A1 test volume uniformity assessment was performed. These results show that the RF absorber retro fit resulted in improved radiated emissions and immunity performance.
Conference: IEEE International Symposium on EMC
Proceedings: IEEE Electromagnetic Compatibility (EMC) Symp.
Pages: 5 pp.
Location: Honolulu, HI
Dates: July 8-14, 2007
Keywords: EMC compliance chamber;field uniformity;retro-fit;time domain;time gating;ultra wideband;verification
Research Areas: Electronics & Telecommunications, Electromagnetics