| Author(s): |
Dennis G. Camell; Michael Taylor; Robert T. Johnk; Benjamin Davis; |
| Title: |
Verification of an EMC facility retro fit using time domain and field uniformity measurements |
| Published: |
July 08, 2007 |
| Abstract: |
This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of insertion data was used to compare before and after measurements of the chamber surfaces. A free space reference provided improved data fidelity. After the update a standard IEC 61000-4-3 A1 test volume uniformity assessment was performed. These results show that the RF absorber retro fit resulted in improved radiated emissions and immunity performance. |
| Conference: |
IEEE International Symposium on EMC |
| Proceedings: |
IEEE Electromagnetic Compatibility (EMC) Symp. |
| Pages: |
5 pp. |
| Location: |
Honolulu, HI |
| Dates: |
July 8-14, 2007 |
| Keywords: |
EMC compliance chamber;field uniformity;retro-fit;time domain;time gating;ultra wideband;verification |
| Research Areas: |
Electronics & Telecommunications, Electromagnetics |
