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NIST Authors in Bold
|Author(s):||Dennis G. Camell; Michael Taylor; Robert T. Johnk; Benjamin Davis;|
|Title:||Verification of an EMC facility retro fit using time domain and field uniformity measurements|
|Published:||July 08, 2007|
|Abstract:||This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of insertion data was used to compare before and after measurements of the chamber surfaces. A free space reference provided improved data fidelity. After the update a standard IEC 61000-4-3 A1 test volume uniformity assessment was performed. These results show that the RF absorber retro fit resulted in improved radiated emissions and immunity performance.|
|Conference:||IEEE International Symposium on EMC|
|Proceedings:||IEEE Electromagnetic Compatibility (EMC) Symp.|
|Dates:||July 8-14, 2007|
|Keywords:||EMC compliance chamber,field uniformity,retro-fit,time domain,time gating,ultra wideband,verification|
|Research Areas:||Electronics & Telecommunications, Electromagnetics|