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|Author(s):||Herbert S. Bennett; Alain C. Diebold; C. M. Garner;|
|Title:||Will Future Measurement Needs for the Semiconductor Industry Be Met?|
|Published:||January 01, 2007|
|Abstract:||We present an assessment of the state of the nation''s measurement system in its ability to meet the metrology needs of the semiconductor industry. Lacking an acceptable metric for the assessing the health of metrology for the semiconductor industry, we identify a limited set of unmet measurement needs. Assuming that this set of needs may serve as a proxy for the galaxy of semiconductor measurement needs, we analyze it from the perspective of what will be required to continue the semiconductor industry''s powerful deflationary force in the world?s macro-economy and to maintain its exceptional record of numerous technological innovations. This paper concludes with some findings and recommendations about ways to strengthen the measurement system for the semiconductor industry.|
|Citation:||Journal of Research (NIST JRES) -|
|Pages:||pp. 25 - 38|
|Keywords:||government role,measurement needs,measurement system,semiconductor industry,solution provider|
|PDF version:||Click here to retrieve PDF version of paper (637KB)|