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|Author(s):||John E. Kitching; Svenja A. Knappe; Li-Anne Liew; John M. Moreland; Hugh Robinson; Peter D. Schwindt; V Shah; V Gerginov; Leo W. Hollberg;|
|Title:||Chip-Scale Atomic Frequency References: Fabrication and Performance|
|Published:||December 01, 2005|
|Abstract:||The physics package for a chip-scale atomic frequency reference was constructed and tested. The device has a total volume of 9.5 mm3, dissipates 75 mW of electrical power at an ambient temperature of 45 °C and has a short-term fractional frequency instability of 2.4×10-10/√υ. Advanced cell fabrication techniques indicate a long-term instability near 1-^-11^ may be feasible.|
|Conference:||19th European Frequency and Time Forum|
|Pages:||pp. 575 - 580|