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Publication Citation: Extending CMOS Measurements to the Nanoscale

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Author(s): David G. Seiler;
Title: Extending CMOS Measurements to the Nanoscale
Published: March 07, 2006
Abstract:
Conference: Seventh International Conference on Microelectronics and Interfaces (ICMI''06)
Proceedings: Proceedings of the Seventh International Conference on Microelectronics and Interfaces (ICMI''06)
Pages: 3 pp.
Location: Austin, TX
Dates: March 6-10, 2006
Research Areas: