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|Author(s):||Paul D. Hale; Dylan F. Williams;|
|Title:||Calibrated Measurement of Optoelectronic Frequency Response|
|Published:||April 01, 2003|
|Abstract:||We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.|
|Citation:||IEEE Transactions on Microwave Theory and Techniques|
|Pages:||pp. 1422 - 1429|
|Keywords:||frequency response,measurement,optoelectronic devices,scattering matrices|
|DOI:||http://dx.doi.org/10.1109/TMTT.2003.809186 (Note: May link to a non-U.S. Government webpage)|