NIST Authors in Bold
| Author(s): | Paul D. Hale; Dylan F. Williams; |
|---|---|
| Title: | Calibrated Measurement of Optoelectronic Frequency Response |
| Published: | April 01, 2003 |
| Abstract: | We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer. |
| Citation: | IEEE Transactions on Microwave Theory and Techniques |
| Volume: | 51 |
| Issue: | 4 |
| Pages: | pp. 1422 - 1429 |
| Keywords: | frequency response;measurement;optoelectronic devices;scattering matrices; |
| Research Areas: | |
| PDF version: | Click here to retrieve PDF version of paper (404KB) |