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Publication Citation: Calibrated Measurement of Optoelectronic Frequency Response

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Author(s): Paul D. Hale; Dylan F. Williams;
Title: Calibrated Measurement of Optoelectronic Frequency Response
Published: April 01, 2003
Abstract: We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Citation: IEEE Transactions on Microwave Theory and Techniques
Volume: 51
Issue: 4
Pages: pp. 1422 - 1429
Keywords: frequency response;measurement;optoelectronic devices;scattering matrices;
Research Areas:
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