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Publication Citation: Calibrated Measurement of Optoelectronic Frequency Response

NIST Authors in Bold

Author(s): Paul D. Hale; Dylan F. Williams;
Title: Calibrated Measurement of Optoelectronic Frequency Response
Published: April 01, 2003
Abstract: We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Citation: IEEE Transactions on Microwave Theory and Techniques
Volume: 51
Issue: 4
Pages: pp. 1422 - 1429
Keywords: frequency response,measurement,optoelectronic devices,scattering matrices
Research Areas:
DOI: http://dx.doi.org/10.1109/TMTT.2003.809186  (Note: May link to a non-U.S. Government webpage)