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Publication Citation: Development of High Conductive Cantilevers for Atomic Force Microscopy Point Contact Measurements

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Author(s): R. E. Thomson; John M. Moreland;
Title: Development of High Conductive Cantilevers for Atomic Force Microscopy Point Contact Measurements
Published: June 01, 1995
Abstract:
Citation: Journal of Vacuum Science and Technology B
Volume: 13 (3)
Pages: pp. 1123 - 1125
Research Areas: Law Enforcement