NIST Authors in Bold
| Author(s): | Jin S. Kim; David G. Seiler; R. A. Lancaster; M. B. Reine; |
|---|---|
| Title: | Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements |
| Published: | December 31, 1996 |
| Abstract: | |
| Citation: | Journal of Electronic Materials |
| Volume: | 25 |
| Issue: | 8 |
| Pages: | pp. 1215 - 1220 |
| Research Areas: |