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Publication Citation: Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements

NIST Authors in Bold

Author(s): Jin S. Kim; David G. Seiler; R. A. Lancaster; M. B. Reine;
Title: Electrical Characterization of Very-Narrow-Gap Bulk HgCdTe Single Crystals by Variable Magnetic-Field-Hall Measurements
Published: December 31, 1996
Abstract:
Citation: Journal of Electronic Materials
Volume: 25
Issue: 8
Pages: pp. 1215 - 1220
Research Areas: