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Publication Citation: Models for Interpreting Measurements Scanning Capacitance Microscope Measurements

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Author(s): Jay F. Marchiando; J R. Lowney; Joseph J. Kopanski;
Title: Models for Interpreting Measurements Scanning Capacitance Microscope Measurements
Published: December 31, 1997
Abstract:
Citation: Scanning Microscopy
Volume: 11
Issue: 1
Pages: pp. 205 - 224
Research Areas: