Publication Citation
NIST Authors in Bold
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| Author(s): | Jay F. Marchiando; J R. Lowney; Joseph J. Kopanski; |
|---|---|
| Title: | Models for Interpreting Measurements Scanning Capacitance Microscope Measurements |
| Published: | December 31, 1997 |
| Abstract: | |
| Citation: | Scanning Microscopy |
| Volume: | 11 |
| Issue: | 1 |
| Pages: | pp. 205 - 224 |
| Research Areas: |