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Publication Citation: Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry

NIST Authors in Bold

Author(s): Nhan V. Nguyen; Joseph G. Pellegrino; Paul M. Amirtharaj; David G. Seiler; S. B. Qadri;
Title: Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published: June 01, 1993
Abstract:
Citation: Journal of Applied Physics
Volume: 73
Issue: 11
Pages: pp. 7739 - 7746
Research Areas: