Publication Citation
NIST Authors in Bold
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| Author(s): | Nhan V. Nguyen; Joseph G. Pellegrino; Paul M. Amirtharaj; David G. Seiler; S. B. Qadri; |
|---|---|
| Title: | Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry |
| Published: | June 01, 1993 |
| Abstract: | |
| Citation: | Journal of Applied Physics |
| Volume: | 73 |
| Issue: | 11 |
| Pages: | pp. 7739 - 7746 |
| Research Areas: |