NIST Authors in Bold
| Author(s): | Jin S. Kim; David G. Seiler; Luigi Colombo; M. C. Chen; |
|---|---|
| Title: | Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements |
| Published: | September 01, 1995 |
| Abstract: | |
| Citation: | Journal of Electronic Materials |
| Research Areas: |