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Publication Citation: Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices

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Author(s): Curt A. Richter; David G. Seiler; Joseph G. Pellegrino; W. F. Tseng; W. R. Thurber;
Title: Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices
Published: December 31, 1995
Abstract:
Proceedings: Semiconductor Characterization - Present Status and Future Needs
Pages: pp. 673 - 677
Location: Gaithersburg, MD
Research Areas: