Publication Citation
NIST Authors in Bold
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| Author(s): | Curt A. Richter; David G. Seiler; Joseph G. Pellegrino; W. F. Tseng; W. R. Thurber; |
|---|---|
| Title: | Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices |
| Published: | December 31, 1995 |
| Abstract: | |
| Proceedings: | Semiconductor Characterization - Present Status and Future Needs |
| Pages: | pp. 673 - 677 |
| Location: | Gaithersburg, MD |
| Research Areas: |