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|Author(s):||Michael D. Janezic; Jeffrey A. Jargon;|
|Title:||Complex Permittivity Determination from Propagation Constant Measurements|
|Published:||February 01, 1999|
|Abstract:||This letter presents a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods, a network analyzer calibration is unnecessary since calibrated scattering parameters are not required. We use measurements in X-band waveguide to show that this technique compares well with the transmission/reflection and cylindrical cavity methods.|
|Citation:||IEEE Microwave and Guided Wave Letters|
|Pages:||pp. 76 - 78|
|Keywords:||dielectric constant,measurement,permittivity,propagation constant|
|DOI:||http://dx.doi.org/10.1109/75.755052 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (59KB)|