NIST Authors in Bold
| Author(s): | James C. Booth; James A. Beall; Donald C. DeGroot; David A. Rudman; Ronald H. Ono; John R. Miller; M. L. Chen; S. H. Hong; Q. Y. Ma; |
|---|---|
| Title: | Microwave Characterization of Coplanar Waveguide Transmission Lines Fabricated by Ion Implantation Patterning of YBa2Cu3O7-d |
| Published: | June 01, 1997 |
| Abstract: | |
| Citation: | IEEE Transactions on Applied Superconductivity |
| Volume: | 7 |
| Issue: | 2 |
| Pages: | pp. 2780 - 2783 |
| Research Areas: | Microwave Measurement Services |