Publication Citation
NIST Authors in Bold
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| Author(s): | J R. Lowney; W. R. Thurber; David G. Seiler; |
|---|---|
| Title: | Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer |
| Published: | May 30, 1994 |
| Abstract: | |
| Citation: | Applied Physics Letters |
| Volume: | 64 |
| Issue: | 22 |
| Pages: | pp. 3015 - 3017 |
| Research Areas: |