NIST logo

Publication Citation: Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer

NIST Authors in Bold

Author(s): J R. Lowney; W. R. Thurber; David G. Seiler;
Title: Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer
Published: May 30, 1994
Abstract:
Citation: Applied Physics Letters
Volume: 64
Issue: 22
Pages: pp. 3015 - 3017
Research Areas: