Publication Citation
NIST Authors in Bold
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| Author(s): | David G. Seiler; J R. Lowney; Chris L. Littler; I. T. Yoon; |
|---|---|
| Title: | Intrinsic Carrier Concentrations in Long Wavelength HgCdTe Based on the New, Nonlinear Temperature Dependence of Eg(x,T) |
| Published: | December 31, 1991 |
| Abstract: | |
| Proceedings: | Proc., Materials Research Society Symposium |
| Volume: | 216 |
| Pages: | pp. 59 - 63 |
| Location: | Boston, MA |
| Dates: | November 26-29, 1990 |
| Research Areas: | |
| PDF version: |  Click here to retrieve PDF version of paper (307KB) |