NIST logo

Publication Citation: Intrinsic Carrier Concentrations in Long Wavelength HgCdTe Based on the New, Nonlinear Temperature Dependence of Eg(x,T)

NIST Authors in Bold

Author(s): David G. Seiler; J R. Lowney; Chris L. Littler; I. T. Yoon;
Title: Intrinsic Carrier Concentrations in Long Wavelength HgCdTe Based on the New, Nonlinear Temperature Dependence of Eg(x,T)
Published: December 31, 1991
Abstract:
Proceedings: Proc., Materials Research Society Symposium
Volume: 216
Pages: pp. 59 - 63
Location: Boston, MA
Dates: November 26-29, 1990
Research Areas:
PDF version: PDF Document Click here to retrieve PDF version of paper (315KB)