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Publication Citation: Lumped-Element Impedance Standards

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Author(s): Dylan F. Williams; David K. Walker;
Title: Lumped-Element Impedance Standards
Published: June 01, 1998
Abstract: We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe construction, and the reference calibration.
Proceedings: Tech Dig., Auto. RF Tech. Group Conf.
Pages: pp. 91 - 93
Location: Baltimore, MD
Dates: June 7-12, 1998
Keywords: ;electrical impedance standard;on-wafer calibration;wafer probes;
Research Areas: Microwave Measurement Services