NIST Authors in Bold
| Author(s): | Roger Marks; Jeffrey A. Jargon; D. K. Rytting; |
|---|---|
| Title: | Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers |
| Published: | June 01, 1998 |
| Abstract: | |
| Proceedings: | Tech. Dig., IEEE MTT-S International Microwave Symposium |
| Pages: | pp. 1487 - 1490 |
| Location: | Baltimore, MD |
| Dates: | June 7-12, 1998 |
| Research Areas: | Microwave Measurement Services |