NIST logo

Publication Citation: Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers

NIST Authors in Bold

Author(s): Roger Marks; Jeffrey A. Jargon; D. K. Rytting;
Title: Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Published: June 01, 1998
Abstract: Several lumped-element calibrations have been proposed for four-sampler vector network analyzers. This paper offers the first assessment of their accuracy in the face of imperfectly defined standards. We discover significant error and introduce a new calibration that offers demonstrably improved accuracy.
Proceedings: Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume: 3
Pages: pp. 1487 - 1490
Location: Baltimore, MD
Dates: June 7-12, 1998
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/MWSYM.1998.700656  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (368KB)