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NIST Authors in Bold
|Author(s):||Dylan F. Williams;|
|Title:||Metal-Insulator-Semiconductor Transmission Line Model|
|Published:||June 01, 1998|
|Abstract:||This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investigates the usual assumption of single-mode propagation and shows that, in certain fairly common circumstances, the fundamental mode of propagation becomes so lossy that it can no longer be considered to be the dominant propagating mode.|
|Proceedings:||Tech Dig., Auto. RF Tech. Group Conf.|
|Pages:||pp. 65 - 71|
|Dates:||June 7-12, 1998|
|Research Areas:||Microwave Measurement Services|
|DOI:||http://dx.doi.org/10.1109/ARFTG.1998.327280 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (461KB)|