Publication Citation
NIST Authors in Bold
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| Author(s): | Mark W. Keller; A P. Chen; John M. Martinis; Neil M. Zimmerman; |
|---|---|
| Title: | A Capacitance Standard Based on Counting Electrons |
| Published: | September 01, 1999 |
| Abstract: | A capacitance standard based directly on the definition of capacitance was built. |
| Citation: | Science |
| Volume: | 285 |
| Pages: | pp. 1706 - 1709 |
| Keywords: | ;capacitance standard;single electron tunneling; |
| Research Areas: | Sensors |
| PDF version: |  Click here to retrieve PDF version of paper (3MB) |