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Publication Citation: Permittivity Measurements on Molecular-Sized Samples, Extended Abstract

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Author(s): A. van Roggen; L. Yuwono; Hui Zhou; Paul H. Meijer; Joseph J. Kopanski;
Title: Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published: December 01, 1990
Abstract:
Proceedings: Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP)
Pages: pp. 385 - 390
Location: Pocono Manor, PA
Dates: October 29-November 1, 1990
Research Areas: