Publication Citation
NIST Authors in Bold
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| Author(s): | A. van Roggen; L. Yuwono; Hui Zhou; Paul H. Meijer; Joseph J. Kopanski; |
|---|---|
| Title: | Permittivity Measurements on Molecular-Sized Samples, Extended Abstract |
| Published: | December 01, 1990 |
| Abstract: | |
| Proceedings: | Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP) |
| Pages: | pp. 385 - 390 |
| Location: | Pocono Manor, PA |
| Dates: | October 29-November 1, 1990 |
| Research Areas: |