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Publication Citation: Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses

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Author(s): Jin S. Kim; David G. Seiler; R. A. Lancaster; M. B. Reine;
Title: Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses
Published: December 31, 1994
Abstract:
Proceedings: Extended Abstracts of the 1995 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Other IR Materials
Pages: pp. 167 - 168
Location: Baltimore, MD
Dates: October 10-12, 1994
Research Areas: