NIST Authors in Bold
| Author(s): | Jin S. Kim; David G. Seiler; R. A. Lancaster; M. B. Reine; |
|---|---|
| Title: | Electrical Characterization of Narrow Gap n-Type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced Conductivity-Tensor Analyses |
| Published: | December 31, 1994 |
| Abstract: | |
| Proceedings: | Extended Abstracts of the 1995 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Other IR Materials |
| Pages: | pp. 167 - 168 |
| Location: | Baltimore, MD |
| Dates: | October 10-12, 1994 |
| Research Areas: |