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Publication Citation: Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites

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Author(s): David G. Seiler; J R. Lowney; W. R. Thurber; Joseph J. Kopanski; George G. Harman;
Title: Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Published: April 01, 1994
Abstract:
Citation: NIST SP -
Research Areas:
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