NIST logo

Publication Citation: Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses

NIST Authors in Bold

Author(s): Jin S. Kim; David G. Seiler; R. A. Lancaster; M. B. Reine;
Title: Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses
Published: December 31, 1995
Abstract:
Proceedings: Extended Abstracts of the 1995 U.S. Workshop on the Physics and Chemistry of Mercury Cadmium Telluride and Other IR Materials
Pages: pp. 31 - 32
Location: Baltimore, MD
Dates: October 10-12, 1995
Research Areas: