NIST Authors in Bold
| Author(s): | Jin S. Kim; David G. Seiler; Luigi Colombo; M. C. Chen; |
|---|---|
| Title: | Electrical Characterization of Liquid-Phase Epitaxially Grown Single-Crystal Films of Mercury Cadmium Telluride by Variable-Magnetic-Field Hall Measurements |
| Published: | December 31, 1994 |
| Abstract: | |
| Citation: | Semiconductor Science and Technology |
| Volume: | 9 |
| Pages: | pp. 1696 - 1705 |
| Research Areas: |