Publication Citation
NIST Authors in Bold
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| Author(s): | Joseph J. Kopanski; John Albers; G. P. Carver; James R. Ehrstein; |
|---|---|
| Title: | Verification of the Relation Between Two-Probe and Four-Probe Resistances as Measured on Silicon Wafers |
| Published: | December 01, 1990 |
| Abstract: | |
| Citation: | Journal of the Electrochemical Society |
| Volume: | 137 |
| Issue: | 12 |
| Pages: | pp. 3935 - 3941 |
| Research Areas: |