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Publication Citation: Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs

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Author(s): David G. Seiler; Santos D. Mayo; J R. Lowney;
Title: Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs
Published: December 31, 1993
Abstract:
Citation: Journal of Semiconductor Science and Technology
Volume: 8
Pages: pp. 753 - 776
Research Areas:
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