| Author(s): |
Angela Hodge; R. Newcomb; Allen R. Hefner Jr; |
| Title: |
Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices |
| Published: |
May 07, 2001 |
| Abstract: |
An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices. |
| Proceedings: |
Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems |
| Pages: |
pp. 281 - 284 |
| Location: |
Sydney, AS |
| Dates: |
May 6-9, 2001 |
| Keywords: |
;BIST;ADC;oscillation;sensor;system-on-a-chip (SOC);mixed signal device; |
| Research Areas: |
Electronics & Telecommunications |
| PDF version: |
 Click here to retrieve PDF version of paper (513KB) |
