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Publication Citation: Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

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Author(s): Angela Hodge; R. Newcomb; Allen R. Hefner Jr;
Title: Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices
Published: May 07, 2001
Abstract: An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices.
Proceedings: Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems
Pages: pp. 281 - 284
Location: Sydney, AS
Dates: May 6-9, 2001
Keywords: ;BIST;ADC;oscillation;sensor;system-on-a-chip (SOC);mixed signal device;
Research Areas: Electronics & Telecommunications
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