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|Author(s):||Angela Hodge; R. Newcomb; Allen R. Hefner Jr.;|
|Title:||Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices|
|Published:||May 07, 2001|
|Abstract:||An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices.|
|Proceedings:||Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems|
|Pages:||pp. 281 - 284|
|Dates:||May 6-9, 2001|
|Keywords:||BIST,ADC,oscillation,sensor,system-on-a-chip (SOC),mixed signal device|
|Research Areas:||Electronics & Telecommunications|
|PDF version:||Click here to retrieve PDF version of paper (526KB)|