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Publication Citation: HgCdTe Detector Reliability Study for the GOES Program

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Author(s): David G. Seiler; George G. Harman; J R. Lowney; Santos D. Mayo; W S. Liggett;
Title: HgCdTe Detector Reliability Study for the GOES Program
Published: September 30, 1991
Abstract:
Citation: NIST Interagency/Internal Report (NISTIR) -
Research Areas:
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