Publication Citation
NIST Authors in Bold
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| Author(s): | Alain C. Diebold; M. Kump; Joseph J. Kopanski; David G. Seiler; |
|---|---|
| Title: | Characterization of Two-Dimensional Dopant Profiles: Status and Review, Extended Abstracts |
| Published: | December 31, 1994 |
| Abstract: | |
| Proceedings: | Extended Abstracts of the Electrochemical Society |
| Volume: | 94-33 |
| Pages: | pp. 78 - 97 |
| Location: | Miami, FL |
| Dates: | October 9-14, 1994 |
| Research Areas: |